Dataray光束质量分析,光斑分析,M2光束分析系统

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Dataray光束质量分析,光斑分析,M2光束分析系统

 

Dataray光束质量分析,光斑分析,M2光束分析系统

美国 DataRay 公司提供激光光束分析仪器,对激光光束的光斑大小,形状和能量分布等参数进行全面的测试和分析;同时与个人电脑连接对分析的结果提供二维或三维的显示,并对分析的结果进行打印输出。适合各种各样的激光光束,帮助你对你的激光光束的品质提供一个量化的结果。

产品分为:
相机式光束质量分析仪(CCD式) Beam Profiling Cameras
狭缝扫描式光束质量分析仪 Slit Scan Beam Profilers

查看Dataray光束质量分析仪的选择向导Dataray光束质量分析仪

相机式光束质量分析仪(CCD式)
Beam Profiling Cameras

WinCamD系列

WinCamD-UCD12
WinCamD-UCD12
WinCamD-UCD15
WinCamD-UCD15
WinCamD-UCD23
WinCamD-UCD23
WinCamD-UHR
WinCamD-UHR
WinCamD-XHR
WinCamD-XHR
WinCamD-FIR-HR
WinCamD-FIR-HR
WinCamD-LCM
WinCamD-LCM


BladeCam-HR和BladeCam-XHR系列

BladeCam-XHR
BladeCam-XHR
System-BladeCam-XHR
BladeCam-XHR-1310
BladeCam-XHR-1310
System-BladeCam-XHR-1310
BladeCam-XHR-UV
BladeCam-XHR-UV
System-BladeCam-XHR-UV
BladeCam-XHR
BladeCam-XHR
System-BladeCam-XHR
BladeCam-XHR-1310
BladeCam-XHR-1310
System-BladeCam-XHR-1310
BladeCam-XHR-UV
BladeCam-XHR-UV
System-BladeCam-XHR-UV


TaperCamD-UCD12和TaperCamD20-15-UCD23系列

TaperCamD-UCD12
TaperCamD-UCD12
System-TaperCamD-UCD12
TaperCamD-UCD12-1310
TaperCamD-UCD12-1310
System-TaperCamD-UCD12-1310
TaperCamD-UCD12-NIR
TaperCamD-UCD12-NIR
System-TaperCamD-UCD12-NIR
TaperCamD20-15-UCD23
TaperCamD20-15-UCD23
System-TaperCamD20-15-UCD23
TaperCamD20-15-UCD23-1310
TaperCamD20-15-UCD23-1310
System-TaperCamD20-15-UCD23-1310
TaperCamD20-15-UCD23-NIR
TaperCamD20-15-UCD23-NIR
System-TaperCamD20-15-UCD23-NIR


相机式光束质量分析仪附件

Filters/Samplers/Attenuators
Filters/Samplers/Attenuators
Lenses/Optics
Lenses/Optics
Translation Stages/Hardware
Translation Stages/Hardware
UV/IR Converters
UV/IR Converters
Replacement Detectors
Replacement Detectors
Replacement Cables
Replacement Cables
Manuals
Manuals

狭缝扫描式光束质量分析仪
Slit Scan Beam Profilers

Beam'R2系列

Beam'R2-Si
Beam'R2-S
System-BR2-Si
Beam'R2-InGaAs
Beam'R2-InGaAs
System-BR2-IGA
Beam'R2-DD Si/InGaAs (190-1750 nm)
Beam'R2-DD Si/InGaAs (190-1750 nm)
System-BR2-DD
Beam'R2-DD Si/InGaAs (190-2300 nm)
Beam'R2-DD Si/InGaAs (190-2300 nm)
System-BR2-DD-2300
Beam'R2-DD Si/InGaAs (190-2500 nm)
Beam'R2-DD Si/InGaAs (190-2500 nm)
System-BR2-DD-2500


BeamMap2 4XY/3XYKE系列

BeamMap2-4XY-Si
BeamMap2-4XY-Si
System-BMS2-4XY-Si
BeamMap2-4XY-InGaAs
BeamMap2-4XY-InGaAs
System-BMS2-4XY-IGA
BeamMap2-4XY-DD Si/InGaAs
BeamMap2-4XY-DD Si/InGaAs
System-BMS2-4XY-DD
BeamMap2-3XYKE-Si
BeamMap2-3XYKE-Si
System-BMS2-3XYKE-Si
BeamMap2-3XYKE-InGaAs
BeamMap2-3XYKE-InGaAs
System-BMS2-3XYKE-IGA
BeamMap2-3XYKE-DD Si/InGaAs
BeamMap2-3XYKE-DD Si/InGaAs
System-BMS2-3XYKE-DD


BeamMap2 ColliMate系列

BeamMap2-CM4-Si
BeamMap2-CM4-Si
System-BMS2-CM4-Si
BeamMap2-CM4-InGaAs
BeamMap2-CM4-InGaAs>
System-BMS2-CM4-IGA
BeamMap2-CM4-DD Si/InGaAs
BeamMap2-CM4-DD Si/InGaAs
System-BMS2-CM4-DD
BeamMap2-CM3-Si
BeamMap2-CM3-Si
System-BMS2-CM3-Si
BeamMap2-CM3-InGaAs
BeamMap2-CM3-InGaAs
System-BMS2-CM3-IGA
BeamMap2-CM3-DD Si/InGaAs
BeamMap2-CM3-DD Si/InGaAs
System-BMS2-CM3-DD


BeamScope-P8 系列

BeamScope-P8-Si
BeamScope-P8-Si
System-BSC-P8-Si
BeamScope-P8-Ge
BeamScope-P8-Ge
System-BSC-P8-Ge
BeamScope-P8-InAs
BeamScope-P8-InAs
System-BSC-P8-IA
BeamScope-P8-Si, extended probe head
BeamScope-P8-Si, extended probe head
System-BSC-P8-Si-EPH
BeamScope-P8-Ge, extended probe head
BeamScope-P8-Ge, extended probe head
System-BSC-P8-Ge-EPH
BeamScope-P8-InAs, extended probe head
BeamScope-P8-InAs, extended probe head
System-BSC-P8-IA-EPH


狭缝扫描式光束质量分析仪附件

Samplers/Attenuators
Samplers/Attenuators
Lenses/Optics
Lenses/Optics>
Translation Stages/Hardware
Translation Stages/Hardware
BeamScope Slits/Pinholes
BeamScope Slits/Pinholes
True2D Sapphire Slits
True2D Sapphire Slits
Replacement Cables
Replacement Cables
Manuals
Manuals

 


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